Synopsys Design for Test (DFT) solutions provide a comprehensive framework to ensure the quality and reliability of complex semiconductor designs. With advanced capabilities for scan-based testing, built-in self-test (BIST), and at-speed testing, Synopsys DFT solutions enable early detection and correction of manufacturing defects. The Synopsys TestMAX™ family integrates seamlessly with the design flow, delivering industry-leading capabilities for high fault coverage, reduced test costs, and faster time-to-yield. Features like automatic test pattern generation (ATPG) and silicon lifecycle management tools optimize test quality and efficiency. Synopsys DFT solutions empower engineers to achieve robust, manufacturable designs, ensuring high-quality outcomes for modern chips. 

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TestMAX DFT

Tool to address cost challenges of design testing across complexities

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